Source & measurement

Device Analyzers & SMUs

Semiconductor characterization instruments paired with the station, cabling and switching architecture your measurement requires.

Configure this system Application review

Semiconductor device analyzer and source measurement system

Configuration range

Built around your device and measurement.

Instrument specifications only hold when the probes, cables, shielding, grounding and fixture are engineered with them. We configure the complete path from analyzer channel to device contact.

System highlights

IV, CV and pulsed IV
Modular SMU and CMU channels
Guarded and triax measurement paths
Automation and probe-station integration

Application fit

Transistor and diode characterization
Low-current leakage
Breakdown and power device test
Capacitance and reliability measurements

Configure with an engineer

Get the complete measurement path.

We will match the station with probes, optics, shielding, thermal control, analyzers and cabling.

Request a configuration +1 727-331-5961