Manual systems

VERSA Probe System

A modular, double-sided manual platform for wafers, die, packages, boards and unusual devices—configured around the measurement.

Configure this system Application review

VERSA double-sided semiconductor probe station

Configuration range

Built around your device and measurement.

VERSA can be configured with precision positioners, microscope systems, guarded or triax signal paths, thermal hardware, light-tight enclosures and the measurement instruments required for your exact test plan.

System highlights

200–450 mm device and wafer configurations
Top and bottom probing access
Ambient, thermal and dark-test options
DC, IV/CV, RF and mmWave integration

Application fit

Failure analysis and device characterization
Decapsulated parts and packages
Power semiconductor and high-voltage test
Research and low-volume engineering

Configure with an engineer

Get the complete measurement path.

We will match the station with probes, optics, shielding, thermal control, analyzers and cabling.

Request a configuration +1 727-331-5961