Automated systems

Auto-Probe 200 / 300

Precision motorized probing with pattern recognition, programmable motion and repeatable wafer-level measurement workflows.

Configure this system Application review

Auto-Probe automated wafer probing system

Configuration range

Built around your device and measurement.

The Auto-Probe platform coordinates motion, optics, alignment, chuck control and electrical instrumentation so engineers can move from an approved manual test sequence to a repeatable automated workflow.

System highlights

200 mm and 300 mm platforms
Automated alignment and wafer mapping
High-power and thermal configurations
Programmable motion and instrument control

Application fit

Wafer-level characterization
Reliability and engineering lots
Automated die probing
Repeatable production-adjacent workflows

Configure with an engineer

Get the complete measurement path.

We will match the station with probes, optics, shielding, thermal control, analyzers and cabling.

Request a configuration +1 727-331-5961