Double Sided Probing, Decapsulated part testing, wafer probing, board, chip, and die testing. 200mm-450mm chuck. Thermal enclosure, dark testing capable. The one station to do nearly any kind of analytical probing.
Custom mounts designed to hold any and all substrates from individual die, flex circuits, wafers, boards.
Value probe systems designed to get great testing results, while maintaining your budget.
Double Sided Probing, Decapsulated part testing, wafer probing, board, chip, and die testing. 200mm-450mm chuck. Thermal enclosure, dark testing capable. The one station to do nearly any kind of analytical probing.
Why Micron Probing?
Micron probing works along side the best testing equipment makers to ensure our customers have a complete semiconductor testing system from oscilloscopes, curve tracers, probe stations, probe holders, probe tips, vibration isolation, dark box, monitors, computers, cameras, and anything else that your IC testing needs require while ensuring that we meet your budget. So if you have a DC, IV, CV, High Voltage, High Frequency, Thermal or light sensetive semiconductor test. We have the equipment to assist you.